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Magazine Name : Ieee Transactions On Reliability

Year : 1998 Volume number : 47 Issue: 04

Rebuttal To: A Critique Of The Reliability-Analysis-Center Failure-Rate-Model For Plastic Encapsulated Microcircuits (Article)
Subject: Plastic Encapsulated Microcircuit (Pem) , Reliability Prediction , Plastic Encapsulated Device , Electronic-Component Reliability
Author: William Denson     
page:      419 - 424
Reliability Assessment With Amalgamated Data Via The Expectation-Maximization Algorithm (Article)
Subject: Failure Rate , Maximum Likelihood , Missing Data , Expectation-Maximization (Em) Algorithm
Author: Evans Gouno      Luc Courtrai     
page:      425 - 430
Some Statistical Characteristics Of A Repairable, Standby, Human And Machine System (Article)
Subject: Common-Cause Failures , Gamma Distribution , Human Error , Steady State Availability
Author: Varadachari Sridharan      Periasamy Mohanavadivu     
page:      431 - 435
A Revised Layered-Network Algorithm To Search For All D-Minpaths Of A Limited-Flow Acyclic Network (Article)
Subject: Limited-Flow Network , Layered Network , D-Minpath , Acyclic Network
Author: Wei-Chang Yeh     
page:      436 - 442
Meadep: A Dependability Evaluation Tool For Engineers (Article)
Subject: Availability , Data Analysis , Evaluation , Markov Chain
Author: Jady Handal      Jeffrey Miller      Myron Hecht      Dong Tang     
page:      443 - 450
Spurious Exponentiality Observed When Incorrectly Fitting A Distribution To Nonstationary Data (Article)
Subject: Repairable System , Nonhomogeneous Poisson Process , Homogeneous Poisson Process , Renewal Process
Author: Harold Ascher      Christian K. Hansen     
page:      451 - 459
A New Explanation Of Decreasing Failure Rate Of A Mixture Of Exponentials (Article)
Subject: Exponential Distribution , Failure Rate , Mixture , Stochastic Order
Author: Jie Mi     
page:      460 - 462
Sequential Tests For Integrated-Circuit Failures (Article)
Subject: Weibull Model , Integrated Circuit Reliability , Failure Rate , Sequential Probability-Ratio Test
Author: R Chandramouli      N. Vijaykrishnan      N Ranganathan     
page:      463 - 471
A Fast Reliability-Algorithm For The Circular Consecutive-Weighted-K-Out-Of-N:F System (Article)
Subject: Consecutive K-Out-Of-N Systems , Computation Complexity , Fast Algorithm , Reliability
Author: Rong-Jaye Chen      Jen-Chun Chang     
page:      472 - 474